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| Journal Article | IMPULSE-2026-00050 |
; ; ;
2026
Elsevier
[Amsterdam]
Please use a persistent id in citations: doi:10.1016/j.nima.2025.171013
Abstract: We present a new isotope-based sample-source setup to enable bulk defect studies on single samples using positrons. For this technique, we employ the positron emitter 22Na (activity of 7 MBq) and modified our Coincidence Doppler Broadening Spectrometer (CDBs). Compared to the commonly used sandwich geometry, where the positron emitter is placed between two “identical” samples for conventional Positron Annihilation Spectroscopy (PAS), the new single specimen setup offers three major advantages: (i) only a single sample is required, (ii) annihilation radiation originating from the source itself or its supporting material is not detected, i.e., there is no source component, and (iii) unwanted -radiation emitted from the positron source (1275 keV -quanta in the case of 22Na) is efficiently suppressed. These three major improvements are demonstrated with Coincidence Doppler Broadening Spectroscopy (CDBS) on single-crystalline copper by comparing spectra recorded with both the sandwich method and a 30 keV positron beam. The Kapton source component is absent and a pure spectrum of bulk copper is obtained.
Keyword(s): Instrument and Method Development (1st) ; Condensed Matter Physics (2nd) ; Instrument and Method Development (2nd)
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