| Home > Publications database > Position Resolved Neutron Depth Profiling with the N4DP Instrument |
| Dissertation / PhD Thesis | IMPULSE-2025-00007 |
2024
TUM
Please use a persistent id in citations: https://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:91-diss-20241213-1759998-0-4 https://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:91-diss-20241213-1759998-0-4
Abstract: Neutron depth profile analysis is a method for the high-precision determination of concentration profiles of certain nuclides in near-surface layers. For an extension to 3D profiling, a detector system based on double-sided silicon strip detectors with a thin and homogeneous dead layer was developed and characterised. The combination of the detectors with application-specific integrated circuits enables profiling at the highest rates.
Keyword(s): Instrument and Method Development (1st) ; Particle Physics (2nd)
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